Event Beta

IEEE International Conference on Artificial Intelligence Testing, AITest 2024, Shanghai, China, July 15-18, 2024

Name: IEEE International Conference on Artificial Intelligence Testing, AITest 2024, Shanghai, China, July 15-18, 2024
Location: Shanghai

Date: 2024
Place: Shanghai, People's Republic of China on the map
Series: International Conference on Artificial Intelligence Testing (AITest)
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e10qd4t

Proceedings

Title	DOI	Year	Record
IEEE International Conference on Artificial Intelligence Testing, AITest 2024, Shanghai, China, July 15-18, 2024	10.1109/aitest62860.2024	2024	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/aitest/aitest2024`

Cite

IEEE International Conference on Artificial Intelligence Testing, AITest 2024, Shanghai, China, July 15-18, 2024. confref identifier e10qd4t. https://id.confref.org/event/e10qd4t

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