Event Beta

IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2025, Ottawa, ON, Canada, April 28-29, 2025

Name: IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2025, Ottawa, ON, Canada, April 28-29, 2025
Location: Ottawa

Date: 2025
Place: Ottawa, Canada on the map
Series: ACM/IEEE International Conference on Automation of Software Test
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e10rnr7

Proceedings

Title	DOI	Year	Record
IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2025, Ottawa, ON, Canada, April 28-29, 2025	10.1109/ast66626.2025	2025	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/ast/ast2025`

Cite

IEEE/ACM International Conference on Automation of Software Test, AST@ICSE 2025, Ottawa, ON, Canada, April 28-29, 2025. confref identifier e10rnr7. https://id.confref.org/event/e10rnr7

Data: Turtle · JSON-LD · N-Triples · RDF/XML

APIs · SPARQL · About the identifiers

Beta confref labs is under development. Identifiers are stable; pages, data and services can change.