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Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China

Name: Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China
Start: 2010-12-01
End: 2010-12-04
Location: Shanghai

ATS

Date: 2010-12-01/04
Place: Shanghai, People's Republic of China on the map
Series: Asian Test Symposium (ATS)
Edition: 19
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10rvep

Proceedings

Title	DOI	Year	Record
Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China		2010	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ats2010` · page
dblp	`https://dblp.org/db/conf/ats/ats2010`

Cite

Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. confref identifier e10rvep. https://id.confref.org/event/e10rvep

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