Event Beta

25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016

Name: 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016
Start: 2016-11-21
End: 2016-11-24
Location: Hiroshima

ATS

Date: 2016-11-21/24
Place: Hiroshima, Japan on the map
Series: Asian Test Symposium (ATS)
Edition: 25
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10rvkb

Proceedings

Title	DOI	Year	Record
25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016		2016	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ats2016` · page
dblp	`https://dblp.org/db/conf/ats/ats2016`

Cite

25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. confref identifier e10rvkb. https://id.confref.org/event/e10rvkb

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