Event Beta

30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021

Name: 30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021
Location: Matsuyama

Date: 2021
Place: Matsuyama, Japan on the map
Series: Asian Test Symposium (ATS)
Edition: 30
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e10rvp5

Proceedings

Title	DOI	Year	Record
30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021	10.1109/ats52891.2021	2021	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/ats/ats2021`

Cite

30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021. confref identifier e10rvp5. https://id.confref.org/event/e10rvp5

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