Event Beta
IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2006, New York, NY, USA, 17-22 June, 2006
- Date
- 2006
- Place
- New York City, United States on the map
- Series
- IEEE/CVF Conference on Computer Vision and Pattern Recognition
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science, computer vision, pattern recognition
- Identifier
https://id.confref.org/event/e10y9s5
Proceedings
Sources
The records of the sources that this identifier brings together (cr:sameAs).
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Cite
IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2006, New York, NY, USA, 17-22 June, 2006. confref identifier e10y9s5. https://id.confref.org/event/e10y9s5
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