Event Beta
Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings
DAGM
- Date
- 1995-01-01
- Place
- Bielefeld, Germany on the map
- Series
- German Conference on Pattern Recognition
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e10yfyn
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings Informatik Aktuell | 10.1007/978-3-642-79980-8 | 1995 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| confref portal (2020) | |
|---|---|
| dblp |
Cite
Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings. confref identifier e10yfyn. https://id.confref.org/event/e10yfyn
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