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Mustererkennung 2000, 22. DAGM-Symposium, Kiel, 13.-15. September 2000, Proceedings

Name: Mustererkennung 2000, 22. DAGM-Symposium, Kiel, 13.-15. September 2000, Proceedings
Start: 2000-01-01
End: 2000-01-01
Location: Kiel

DAGM

Date: 2000-01-01
Place: Kiel, Germany on the map
Series: German Conference on Pattern Recognition
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10yg3b

Proceedings

Title	DOI	Year	Record
Mustererkennung 2000, 22. DAGM-Symposium, Kiel, 13.-15. September 2000, Proceedings Informatik Aktuell	10.1007/978-3-642-59802-9	2000	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/dagm2000` · page
dblp	`https://dblp.org/db/conf/dagm/dagm2000`

Cite

Mustererkennung 2000, 22. DAGM-Symposium, Kiel, 13.-15. September 2000, Proceedings. confref identifier e10yg3b. https://id.confref.org/event/e10yg3b

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