Event Beta

4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008

Name: 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008
Start: 2008-01-01
End: 2008-01-01
Location: Hong Kong

DELTA

Date: 2008-01-01
Place: Hong Kong, People's Republic of China
Series: Electronic Design, Test and Applications (DELTA)
Edition: 4
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10z4km

Proceedings

Title	DOI	Year	Record
4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008		2008	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/delta2008` · page
dblp	`https://dblp.org/db/conf/delta/delta2008`

Cite

4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. confref identifier e10z4km. https://id.confref.org/event/e10z4km

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