Event Beta
The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings
DFT
- Date
- 1993-10-27/29
- Place
- Venice, Italy on the map
- Series
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e10z9s3
Proceedings
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| confref portal (2020) | |
|---|---|
| dblp |
Cite
The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. confref identifier e10z9s3. https://id.confref.org/event/e10z9s3
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