Event Beta
16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings
DFT
- Date
- 2001-10-24/26
- Place
- San Francisco, United States on the map
- Series
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
- Edition
- 16
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e10za0n
Proceedings
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| confref portal (2020) | |
|---|---|
| dblp |
Cite
16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. confref identifier e10za0n. https://id.confref.org/event/e10za0n
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