Event Beta
17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings
DFT
- Date
- 2002-01-01
- Place
- Vancouver, Canada on the map
- Series
- IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
- Edition
- 17
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e10za1k
Proceedings
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| confref portal (2020) | |
|---|---|
| dblp |
Cite
17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. confref identifier e10za1k. https://id.confref.org/event/e10za1k
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