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Event Beta

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy.

DFT
Date
2007-09-26/28
Place
Rome, Italy on the map
Series
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Edition
22
Academic field
Natural sciences: Computer and information sciences
Disciplines
computer science
Identifier
https://id.confref.org/event/e10za69

Proceedings

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)
dblp

Cite

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy.. confref identifier e10za69. https://id.confref.org/event/e10za69

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