Event Beta

Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015

Name: Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015
Location: San Francisco

Date: 2015
Place: San Francisco, United States on the map
Series: Material Appearance (MAPP)
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e1115md

Proceedings

Title	DOI	Year	Record
Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015 SPIE Proceedings 9398		2015	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/ei-maap/ei-maap2015`

Cite

Measuring, Modeling, and Reproducing Material Appearance 2015, San Francisco, California, United States, February 9-10, 2015. confref identifier e1115md. https://id.confref.org/event/e1115md

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