Event Beta

Measuring, Modeling, and Reproducing Material Appearance 2016, San Francisco, CA, USA, February 14-18, 2016

Name: Measuring, Modeling, and Reproducing Material Appearance 2016, San Francisco, CA, USA, February 14-18, 2016
Location: San Francisco

Date: 2016
Place: San Francisco, United States on the map
Series: Material Appearance (MAPP)
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e1115nb

Proceedings

Title	DOI	Year	Record
Measuring, Modeling, and Reproducing Material Appearance 2016, San Francisco, CA, USA, February 14-18, 2016		2016	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/ei-maap/ei-maap2016`

Cite

Measuring, Modeling, and Reproducing Material Appearance 2016, San Francisco, CA, USA, February 14-18, 2016. confref identifier e1115nb. https://id.confref.org/event/e1115nb

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