Event Beta
Proceedings of the 2006 International Workshop on Automation of Software Test, AST 2006, Shanghai, China, May 23, 2006.
- Date
- 2006
- Place
- Shanghai, People's Republic of China on the map
- Series
- ACM/IEEE International Conference on Automation of Software Test
- Academic field
- Natural sciences: Computer and information sciences
- Identifier
https://id.confref.org/event/e11a1tk
Proceedings
Sources
The records of the sources that this identifier brings together (cr:sameAs).
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Cite
Proceedings of the 2006 International Workshop on Automation of Software Test, AST 2006, Shanghai, China, May 23, 2006.. confref identifier e11a1tk. https://id.confref.org/event/e11a1tk
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