Event Beta

2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017

Name: 2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017
Start: 2017-03-13
End: 2017-03-17
Location: Tokyo

ICST

Date: 2017-03-13/17
Place: Tokyo, Japan on the map
Series: International Conference on Software Testing, Verification and Validation
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11ap67

Proceedings

Title	DOI	Year	Record
2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017		2017	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/icst2017` · page
dblp	`https://dblp.org/db/conf/icst/icst2017`

Cite

2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017. confref identifier e11ap67. https://id.confref.org/event/e11ap67

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