Event Beta

2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017

Name: 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017
Location: Tokyo

Date: 2017
Place: Tokyo, Japan on the map
Series: International Conference on Software Testing, Verification and Validation
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, software testing
Identifier: https://id.confref.org/event/e11apyp

Proceedings

Title	DOI	Year	Record
2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017		2017	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/icst/icstw2017`

Cite

2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. confref identifier e11apyp. https://id.confref.org/event/e11apyp

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