Event Beta

3rd International Symposium on Quality of Electronic Design, ISQED 2002, San Jose, CA, USA, March 18-21, 2002

Name: 3rd International Symposium on Quality of Electronic Design, ISQED 2002, San Jose, CA, USA, March 18-21, 2002
Start: 2002-03-18
End: 2002-03-21
Location: San Jose

ISQED

Date: 2002-03-18/21
Place: San Jose, United States on the map
Series: IEEE International Symposium on Quality Electronic Design (ISQED)
Edition: 3
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11eeyp

Proceedings

Title	DOI	Year	Record
3rd International Symposium on Quality of Electronic Design, ISQED 2002, San Jose, CA, USA, March 18-21, 2002		2002	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/isqed2002` · page
dblp	`https://dblp.org/db/conf/isqed/isqed2002`

Cite

3rd International Symposium on Quality of Electronic Design, ISQED 2002, San Jose, CA, USA, March 18-21, 2002. confref identifier e11eeyp. https://id.confref.org/event/e11eeyp

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