Event Beta

6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA

Name: 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA
Start: 2005-03-21
End: 2005-03-23
Location: San Jose

ISQED

Date: 2005-03-21/23
Place: San Jose, United States on the map
Series: IEEE International Symposium on Quality Electronic Design (ISQED)
Edition: 6
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11ef1g

Proceedings

Title	DOI	Year	Record
6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA		2005	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/isqed2005` · page
dblp	`https://dblp.org/db/conf/isqed/isqed2005`

Cite

6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. confref identifier e11ef1g. https://id.confref.org/event/e11ef1g

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