Event Beta

53rd IEEE International Test Conference

Name: 53rd IEEE International Test Conference
Start: 2022-09-25
End: 2022-09-30
Location: Anaheim

ITC 2022

Date: 2022-09-25/30
Place: Anaheim, United States on the map
Series: International Test Conference (ITC), IEEE International Test Conference
Attendance: on site
Status: as scheduled
Academic field: Natural sciences: Computer and information sciences
Engineering and technology: Electrical engineering, electronic engineering, information engineering
Disciplines: electrical engineering
Identifier: https://id.confref.org/event/e11ez2y

Proceedings

Title	DOI	Year	Record
IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022	10.1109/itc50671.2022	2022	dblp

The records of the sources that this identifier brings together (cr:sameAs).

ConfIDent	`https://id.confref.org/data/confident/37071` · page
dblp	`https://dblp.org/db/conf/itc/itc2022`

53rd IEEE International Test Conference. confref identifier e11ez2y. https://id.confref.org/event/e11ez2y

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