Event Beta

IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2025, Ancona, Italy, October 22-24, 2025

Name: IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2025, Ancona, Italy, October 22-24, 2025
Location: Ancona

Date: 2025
Place: Ancona, Italy on the map
Series: International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e11hqqm

Proceedings

Title	DOI	Year	Record
IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2025, Ancona, Italy, October 22-24, 2025	10.1109/metroxraine66377.2025	2025	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/metroxraine/metroxraine2025`

Cite

IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2025, Ancona, Italy, October 22-24, 2025. confref identifier e11hqqm. https://id.confref.org/event/e11hqqm

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