# https://id.confref.org/event/e11kgce (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e11kgce>
    a cr:Event ;
    schema:alternateName "MTDT" ;
    schema:endDate "2003-07-29"^^xsd:date ;
    schema:location wd:Q16553 ;
    schema:name "11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA" ;
    schema:startDate "2003-07-28"^^xsd:date ;
    rdfs:label "11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA" ;
    cr:discipline wd:Q21198 ;
    cr:edition "11"^^xsd:integer ;
    cr:field <https://id.confref.org/data/oecd-fos/1.2> ;
    cr:inSeries <https://id.confref.org/series/s10bp90> ;
    cr:proceedings <https://dblp.org/rec/conf/mtdt/2003> ;
    cr:sameAs <https://dblp.org/db/conf/mtdt/mtdt2003> ,
        <https://id.confref.org/data/confref-portal/event/mtdt2003> ;
    cr:year "2003"^^xsd:gYear .