Event Beta

Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2010, Oakland, CA, USA, May 20, 2010

Name: Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2010, Oakland, CA, USA, May 20, 2010
Start: 2010-05-20
End: 2010-05-20
Location: Oakland

SADFE

Date: 2010-05-20
Place: Oakland, United States on the map
Series: Systematic Approaches to Digital Forensic Engineering (SADFE)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11qv2f

Proceedings

Title	DOI	Year	Record
Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2010, Oakland, CA, USA, May 20, 2010		2010	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/sadfe2010` · page
dblp	`https://dblp.org/db/conf/sadfe/sadfe2010`

Cite

Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2010, Oakland, CA, USA, May 20, 2010. confref identifier e11qv2f. https://id.confref.org/event/e11qv2f

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