Event Beta

International Conference on Measurement and Modeling of Computer Systems

Name: International Conference on Measurement and Modeling of Computer Systems
Start: 2004-06-10
End: 2004-06-14
Location: New York City

SIGMETRICS 2004SIGMETRICS

Date: 2004-06-10/14
Place: New York City, United States on the map
Series: International Conference on Measurement and Modeling of Computer Systems
Attendance: on site
Status: as scheduled
Website: http://acm.org/sigmetrics/
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11tdjp

Proceedings

Title	DOI	Year	Record
Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA	10.1145/1005686	2004	dblp

Where the sources disagree

start date: confident: 2004-06-10; confref-portal: 2004-01-01

The facts above are taken from the source first in precedence (ConfIDent, Springer, dblp, Wikidata, the portal, the GND).

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/sigmetrics2004` · page
ConfIDent	`https://id.confref.org/data/confident/13863` · page
dblp	`https://dblp.org/db/conf/sigmetrics/sigmetrics2004`

Cite

International Conference on Measurement and Modeling of Computer Systems. confref identifier e11tdjp. https://id.confref.org/event/e11tdjp

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