Event Beta

International Conference on Measurement and Modeling of Computer Systems

Name: International Conference on Measurement and Modeling of Computer Systems
Start: 2010-06-14
End: 2010-06-18
Location: New York City

SIGMETRICS 2010SIGMETRICS

Date: 2010-06-14/18
Place: New York City, United States on the map
Series: International Conference on Measurement and Modeling of Computer Systems
Attendance: on site
Status: as scheduled
Website: https://www.sigmetrics.org/sigmetrics2010/
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11tdra

Proceedings

Title	DOI	Year	Record
SIGMETRICS 2010, Proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, New York, USA, 14-18 June 2010	10.1145/1811039	2010	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/sigmetrics2010` · page
ConfIDent	`https://id.confref.org/data/confident/34291` · page
dblp	`https://dblp.org/db/conf/sigmetrics/sigmetrics2010`

Cite

International Conference on Measurement and Modeling of Computer Systems. confref identifier e11tdra. https://id.confref.org/event/e11tdra

Data: Turtle · JSON-LD · N-Triples · RDF/XML

APIs · SPARQL · About the identifiers

Beta confref labs is under development. Identifiers are stable; pages, data and services can change.