# https://id.confref.org/event/e11te6e (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e11te6e>
    a cr:Event ;
    schema:location wd:Q1376559 ;
    schema:name "Abstracts of the 2025 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2025, Stony Brook, NY, USA, June 9-13, 2025" ;
    rdfs:label "Abstracts of the 2025 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS 2025, Stony Brook, NY, USA, June 9-13, 2025" ;
    cr:discipline wd:Q21198 ;
    cr:field <https://id.confref.org/data/oecd-fos/1.2> ;
    cr:inSeries <https://id.confref.org/series/s10b0qs> ;
    cr:proceedings <https://dblp.org/rec/conf/sigmetrics/2025> ;
    cr:sameAs <https://dblp.org/db/conf/sigmetrics/sigmetrics2025> ;
    cr:year "2025"^^xsd:gYear .