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Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Santa Clara, California, USA, May 10-14, 1993

Name: Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Santa Clara, California, USA, May 10-14, 1993
Location: Santa Clara

Date: 1993
Place: Santa Clara, United States on the map
Series: International Conference on Measurement and Modeling of Computer Systems
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11tekk

Proceedings

Title	DOI	Year	Record
Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Santa Clara, California, USA, May 10-14, 1993	10.1145/166955	1993	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/sigmetrics/sigmetrics93`

Cite

Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Santa Clara, California, USA, May 10-14, 1993. confref identifier e11tekk. https://id.confref.org/event/e11tekk

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