Event Beta
VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
- Date
- 2022
- Place
- Jammu, India on the map
- Series
- International Symposium on VLSI Design and Test (VDAT)
- Edition
- 26
- Academic field
- Natural sciences: Computer and information sciences
- Identifier
https://id.confref.org/event/e11y0y3
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers Communications in Computer and Information Science 1687 | 10.1007/978-3-031-21514-8 | 2022 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| dblp |
|---|
Cite
VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. confref identifier e11y0y3. https://id.confref.org/event/e11y0y3
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