Event Beta

2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017

Name: 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017
Start: 2017-04-24
End: 2017-04-27
Location: Hsinchu City

VLSI-DAT

Date: 2017-04-24/27
Place: Hsinchu City, Taiwan on the map
Series: International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11yb3f

Proceedings

Title	DOI	Year	Record
2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017		2017	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vlsi-dat2017` · page
dblp	`https://dblp.org/db/conf/vlsi-dat/vlsi-dat2017`

Cite

2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. confref identifier e11yb3f. https://id.confref.org/event/e11yb3f

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