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VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Name: VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Location: Daejeon

Date: 2015
Place: Daejeon, South Korea on the map
Series: IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chip (VLSI-SOC)
Edition: 23
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e11ybvy

Proceedings

Title	DOI	Year	Record
VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers IFIP Advances in Information and Communication Technology 483	10.1007/978-3-319-46097-0	2016	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/vlsi/vlsisoc2015s`

Cite

VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers. confref identifier e11ybvy. https://id.confref.org/event/e11ybvy

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