Event Beta
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability - 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
- Date
- 2016
- Place
- Tallinn, Estonia on the map
- Series
- IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chip (VLSI-SOC)
- Edition
- 24
- Academic field
- Natural sciences: Computer and information sciences
- Identifier
https://id.confref.org/event/e11ybww
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability - 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers IFIP Advances in Information and Communication Technology 508 | 10.1007/978-3-319-67104-8 | 2017 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| dblp |
|---|
Cite
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability - 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers. confref identifier e11ybww. https://id.confref.org/event/e11ybww
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