Event Beta

19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA

Name: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA
Start: 2001-05-03
End: 2001-05-03
Location: Marina del Rey

VTS

Date: 2001-05-03
Place: Marina del Rey, United States on the map
Series: IEEE VLSI Test Symposium (VTS)
Edition: 19
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11ynh8

Proceedings

Title	DOI	Year	Record
19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA		2001	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vts2001` · page
dblp	`https://dblp.org/db/conf/vts/vts2001`

Cite

19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. confref identifier e11ynh8. https://id.confref.org/event/e11ynh8

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