Event Beta

23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA

Name: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA
Start: 2005-05-01
End: 2005-05-05
Location: Palm Springs

VTS

Date: 2005-05-01/05
Place: Palm Springs, United States on the map
Series: IEEE VLSI Test Symposium (VTS)
Edition: 23
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11ynn0

Proceedings

Title	DOI	Year	Record
23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA		2005	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vts2005` · page
dblp	`https://dblp.org/db/conf/vts/vts2005`

Cite

23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. confref identifier e11ynn0. https://id.confref.org/event/e11ynn0

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