Event Beta

24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA

Name: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA
Start: 2006-05-04
End: 2006-05-04
Location: Berkeley

VTS

Date: 2006-05-04
Place: Berkeley, United States on the map
Series: IEEE VLSI Test Symposium (VTS)
Edition: 24
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11ynpy

Proceedings

Title	DOI	Year	Record
24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA		2006	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vts2006` · page
dblp	`https://dblp.org/db/conf/vts/vts2006`

Cite

24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. confref identifier e11ynpy. https://id.confref.org/event/e11ynpy

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