Event Beta

28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA

Name: 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA
Start: 2010-04-19
End: 2010-04-22
Location: Santa Cruz

VTS

Date: 2010-04-19/22
Place: Santa Cruz, United States on the map
Series: IEEE VLSI Test Symposium (VTS)
Edition: 28
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11yntp

Proceedings

Title	DOI	Year	Record
28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA		2010	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vts2010` · page
dblp	`https://dblp.org/db/conf/vts/vts2010`

Cite

28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. confref identifier e11yntp. https://id.confref.org/event/e11yntp

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