Event Beta

31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013

Name: 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013
Start: 2013-04-29
End: 2013-05-02
Location: Berkeley

VTS

Date: 2013-04-29 to 2013-05-02
Place: Berkeley, United States on the map
Series: IEEE VLSI Test Symposium (VTS)
Edition: 31
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e11ynxg

Proceedings

Title	DOI	Year	Record
31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013		2013	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vts2013` · page
dblp	`https://dblp.org/db/conf/vts/vts2013`

Cite

31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. confref identifier e11ynxg. https://id.confref.org/event/e11ynxg

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