Event Beta
32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014
VTS
- Date
- 2014-04-13/17
- Place
- Napa, United States on the map
- Series
- IEEE VLSI Test Symposium (VTS)
- Edition
- 32
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e11ynye
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| 32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014 | 2014 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| confref portal (2020) | |
|---|---|
| dblp |
Cite
32nd IEEE VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. confref identifier e11ynye. https://id.confref.org/event/e11ynye
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