# https://id.confref.org/event/e123xjm (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e123xjm>
    a cr:Event ;
    schema:alternateName "ICMTS 2018" ;
    schema:endDate "2018-03-22"^^xsd:date ;
    schema:eventAttendanceMode schema:OfflineEventAttendanceMode ;
    schema:eventStatus schema:EventScheduled ;
    schema:location wd:Q16559 ;
    schema:name "31st IEEE International Conference on Microelectronic Test Structures" ;
    schema:startDate "2018-03-19"^^xsd:date ;
    schema:url <https://icmts.net/archives/program2018.html> ;
    rdfs:label "31st IEEE International Conference on Microelectronic Test Structures" ;
    cr:discipline wd:Q175403 ;
    cr:edition "31"^^xsd:integer ;
    cr:field <https://id.confref.org/data/oecd-fos/2.2> ;
    cr:inSeries <https://id.confref.org/series/s126gy3> ;
    cr:sameAs <https://id.confref.org/data/confident/10023> ;
    cr:year "2018"^^xsd:gYear .