Event Beta
IEEE Circuits and Systems International Conference on Testing and Diagnosis
ICTD 2008
- Date
- 2008-10-25/26
- Place
- Chengdu, People's Republic of China on the map
- Attendance
- on site
- Status
- as scheduled
- Website
- http://ictd08.uestc.edu.cn/index.php?show=call4paper
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer architecture
- Identifier
https://id.confref.org/event/e1241kc
Sources
The records of the sources that this identifier brings together (cr:sameAs).
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Cite
IEEE Circuits and Systems International Conference on Testing and Diagnosis. confref identifier e1241kc. https://id.confref.org/event/e1241kc
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.