Event Beta

IEEE International Workshop on Register Transfer Level and High Level Testing

Name: IEEE International Workshop on Register Transfer Level and High Level Testing
Start: 2008-11-27
End: 2008-11-28
Location: Sapporo

WRTLT 2008

Date: 2008-11-27/28
Place: Sapporo, Japan on the map
Attendance: on site
Status: as scheduled
Website: http://aries3a.cse.kyutech.ac.jp/wrtlt08
Disciplines: computer science
Identifier: https://id.confref.org/event/e126x1h

Sources

The records of the sources that this identifier brings together (cr:sameAs).

ConfIDent	`https://id.confref.org/data/confident/20776` · page

Cite

IEEE International Workshop on Register Transfer Level and High Level Testing. confref identifier e126x1h. https://id.confref.org/event/e126x1h

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