Event Beta
IEEE Semiconductor Wafer Test Workshop
SWTW 2008
- Date
- 2008-06-08/11
- Place
- San Diego, United States on the map
- Attendance
- on site
- Status
- as scheduled
- Website
- http://www.swtest.org/index.html
- Academic field
- Engineering and technology
- Identifier
https://id.confref.org/event/e127dva
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| ConfIDent |
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Cite
IEEE Semiconductor Wafer Test Workshop. confref identifier e127dva. https://id.confref.org/event/e127dva
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.