Event Beta
IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability
ASTR 2008
- Date
- 2008-10-01/03
- Place
- Portland, United States on the map
- Attendance
- on site
- Status
- as scheduled
- Website
- http://www.ewh.ieee.org/soc/cpmt/tc7/ast2008
- Academic field
- Engineering and technology
- Identifier
https://id.confref.org/event/e12fk51
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| ConfIDent |
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Cite
IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability. confref identifier e12fk51. https://id.confref.org/event/e12fk51
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