Event Beta
IEEE International Workshop on Electronic Design, Test and Application
DELTA 2008
- Date
- 2008-01-23/25
- Place
- Kowloon, People's Republic of China on the map
- Attendance
- on site
- Status
- as scheduled
- Website
- http://www.ece.ust.hk/delta2008/Call.htm
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e12g685
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| ConfIDent |
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Cite
IEEE International Workshop on Electronic Design, Test and Application. confref identifier e12g685. https://id.confref.org/event/e12g685
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