# https://id.confref.org/event/e12gg8v (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e12gg8v>
    a cr:Event ;
    schema:alternateName "EI 2018" ;
    schema:endDate "2018-02-02"^^xsd:date ;
    schema:eventAttendanceMode schema:OfflineEventAttendanceMode ;
    schema:eventStatus schema:EventScheduled ;
    schema:location wd:Q986867 ;
    schema:name "Electronic Imaging  2018 : IS&T International Symposium on Electronic Imaging 2018" ;
    schema:startDate "2018-01-28"^^xsd:date ;
    schema:url <https://www.imaging.org/IST/IST/Conferences/EI/EI_2018/Symposium_Overview.aspx?hkey=cd323912-80a2-4d94-894a-2a94fdf24fda> ;
    rdfs:label "Electronic Imaging  2018 : IS&T International Symposium on Electronic Imaging 2018" ;
    cr:discipline wd:Q170519 ;
    cr:field <https://id.confref.org/data/oecd-fos/1.2> ;
    cr:inSeries <https://id.confref.org/series/s12fgbr> ;
    cr:sameAs <https://id.confref.org/data/confident/8127> ;
    cr:year "2018"^^xsd:gYear .