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ICMTS 2009

https://id.confref.org/data/confident/10021

This record is part of the confref event IEEE International Conference on Microelectronic Test Structures 2009.

rdf:typecf:Category_Event
schema:locationOxnard (wd:Q209338)
rdfs:labelICMTS 2009
cf:Academic_Fieldhttps://id.confref.org/data/confident/29661
cf:AcronymICMTS 2009
cf:CityOxnard
cf:Countryhttps://id.confref.org/data/confident/31086
cf:Country_Missingfalse
cf:Creation_date2022-04-06T22:38:28
cf:Display_TitleICMTS 2009
cf:End_Date2009-04-02
cf:Event_Modeon site
cf:Event_Statusas scheduled
cf:Has_Metricfalse
cf:Has_subobjecthttps://id.confref.org/data/confident/10021/42317dd8a39fe8e19a967e566724b408
cf:Has_subobjecthttps://id.confref.org/data/confident/10021/706bdc8beeec07395a749eb4507fc8eb
cf:In_Event_Serieshttps://id.confref.org/data/confident/1564
cf:Modification_date2023-10-10T13:55:03
cf:Month3
cf:Official_Websitehttp://www.see.ed.ac.uk/ICMTS
cf:Organizer_Missingfalse
cf:RegionCalifornia
cf:Single_Day_Eventno
cf:Start_Date2009-03-30
cf:Start_Date_Missingfalse
cf:Submission_Deadline2008-09-15
cf:TitleIEEE International Conference on Microelectronic Test Structures 2009
cf:Year2009
cf:pagehttps://www.confident-conference.org/index.php/Event:ICMTS_2009
cf:pageTitleEvent:ICMTS 2009
cr:disciplinemicroelectronics (wd:Q175403)
cr:fieldElectrical engineering, electronic engineering, information engineering (https://id.confref.org/data/oecd-fos/2.2)

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