Record Beta
ICMTS - International Conference on Microelectronic Test Structures
https://id.confref.org/data/confident/1564
This record is part of the confref series International Conference on Microelectronic Test Structures.
| rdf:type | cf:Category_Event_Series |
|---|---|
| rdfs:label | ICMTS - International Conference on Microelectronic Test Structures |
| cf:Academic_Field | https://id.confref.org/data/confident/29661 |
| cf:Acronym | ICMTS |
| cf:Creation_date | 2022-04-06T19:05:15 |
| cf:DOI | 10.25798/bpa6-ch73 |
| cf:Display_Title | ICMTS - International Conference on Microelectronic Test Structures |
| cf:Has_subobject | https://id.confref.org/data/confident/1564/10ae9f73d025a89e5c94501e4625d368 |
| cf:Maintainer_Missing | false |
| cf:Modification_date | 2023-10-11T08:33:01 |
| cf:Official_Website | http://www.icmts.net |
| cf:Title | International Conference on Microelectronic Test Structures |
| cf:page | https://www.confident-conference.org/index.php/Event_Series:ICMTS |
| cf:pageTitle | Event Series:ICMTS |
| cr:discipline | microelectronics (wd:Q175403) |
| cr:field | Electrical engineering, electronic engineering, information engineering (https://id.confref.org/data/oecd-fos/2.2) |
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