Conference series Beta
International Conference on Microelectronic Test Structures
ICMTS
- Events
- 8 (2008 to 2024)
- Website
- http://www.icmts.net
- Academic field
- Engineering and technology: Electrical engineering, electronic engineering, information engineering
- Disciplines
- microelectronics
- Identifier
https://id.confref.org/series/s126gy3
Events (8)
20082024
| Year | No. | Event | Place | Date |
|---|---|---|---|---|
| 2024 | 36 | International Conference on Microelectronic Test Structures 2024 ICMTS 2024 | Edinburgh | 2024-04-15/18 |
| 2023 | 35 | International Conference on Microelectronic Test Structures 2023 ICMTS 2023 | Tokyo | 2023-03-27/30 |
| 2022 | 34 | International Conference on Microelectronic Test Structures 2022 ICMTS 2022 | 2022-03-21/24 | |
| 2020 | 33 | 33rd IEEE International Conference on Microelectronic Test Structures ICMTS 2020 | 2020-05-04/17 | |
| 2019 | 32 | 32nd IEEE International Conference on Microelectronic Test Structures ICMTS 2019 | Kitakyūshū | 2019-03-18/21 |
| 2018 | 31 | 31st IEEE International Conference on Microelectronic Test Structures ICMTS 2018 | Austin | 2018-03-19/22 |
| 2009 | IEEE International Conference on Microelectronic Test Structures 2009 ICMTS 2009 | Oxnard | 2009-03-30 to 2009-04-02 | |
| 2008 | IEEE International Conference on Microelectronic Test Structures 2008 ICMTS 2008 | Edinburgh | 2008-03-24/27 |
The events on the map · in the search · calendar of coming events
Sources
The records of the sources that this identifier brings together (cr:sameAs).
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Cite
International Conference on Microelectronic Test Structures. confref identifier s126gy3. https://id.confref.org/series/s126gy3
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