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ICMTS 2020

https://id.confref.org/data/confident/10025

This record is part of the confref event 33rd IEEE International Conference on Microelectronic Test Structures.

rdf:typecf:Category_Event
rdfs:labelICMTS 2020
cf:Academic_Fieldhttps://id.confref.org/data/confident/29661
cf:AcronymICMTS 2020
cf:Country_Missingtrue
cf:Creation_date2022-04-06T22:38:34
cf:Display_TitleICMTS 2020
cf:End_Date2020-05-17
cf:Event_Modeonline
cf:Event_Statusas scheduled
cf:Has_Metricfalse
cf:Has_subobjecthttps://id.confref.org/data/confident/10025/706bdc8beeec07395a749eb4507fc8eb
cf:Has_subobjecthttps://id.confref.org/data/confident/10025/9969b94d11ce17bb73e47ddfd2199753
cf:In_Event_Serieshttps://id.confref.org/data/confident/1564
cf:Modification_date2023-10-10T13:47:31
cf:Month5
cf:Official_Websitehttps://icmts.net/archives/program2020.html
cf:Ordinal33
cf:Organizer_Missingfalse
cf:Single_Day_Eventno
cf:Start_Date2020-05-04
cf:Start_Date_Missingfalse
cf:Submission_Deadline2021-10-29
cf:Title33rd IEEE International Conference on Microelectronic Test Structures
cf:Year2020
cf:pagehttps://www.confident-conference.org/index.php/Event:ICMTS_2020
cf:pageTitleEvent:ICMTS 2020
cr:disciplinemicroelectronics (wd:Q175403)
cr:fieldElectrical engineering, electronic engineering, information engineering (https://id.confref.org/data/oecd-fos/2.2)

Data: Turtle · JSON-LD · N-Triples · RDF/XML

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