Record Beta

SIGMETRICS 2010

https://id.confref.org/data/confident/34291

This record is part of the confref event International Conference on Measurement and Modeling of Computer Systems.

rdf:type	cf:Category_Event
schema:location	New York City (wd:Q60)
rdfs:label	SIGMETRICS 2010
cf:Abstract_Deadline	2009-11-02
cf:Academic_Field	https://id.confref.org/data/confident/26988
cf:Acronym	SIGMETRICS 2010
cf:City	New York City
cf:Country	https://id.confref.org/data/confident/31086
cf:Country_Missing	false
cf:Creation_date	2022-11-02T13:04:51
cf:Display_Title	SIGMETRICS 2010
cf:End_Date	2010-06-18
cf:Event_Mode	on site
cf:Event_Status	as scheduled
cf:Has_Metric	false
cf:Has_subobject	https://id.confref.org/data/confident/34291/07ed613c780852aa32ed07eef119aa8e
cf:Has_subobject	https://id.confref.org/data/confident/34291/c4b93ee3b7c0a7a4ea24603238e26917
cf:Has_subobject	https://id.confref.org/data/confident/34291/dec7b1d17e9125e0eacf11a8ea0865c9
cf:Has_subobject	https://id.confref.org/data/confident/34291/ff0a49bf734bc7ab6b87e4d887469129
cf:In_Event_Series	https://id.confref.org/data/confident/2007
cf:Modification_date	2022-11-04T16:18:21
cf:Month	6
cf:Notification_Deadline	2010-02-09
cf:Official_Website	https://www.sigmetrics.org/sigmetrics2010/
cf:Organizer_Missing	false
cf:Paper_Deadline	2009-11-09
cf:Region	New York
cf:Single_Day_Event	no
cf:Start_Date	2010-06-14
cf:Start_Date_Missing	false
cf:Title	International Conference on Measurement and Modeling of Computer Systems
cf:Venue	Schapiro Center
cf:Year	2010
cf:page	https://www.confident-conference.org/index.php/Event:C7c9a623-5969-44a5-ab86-c741514301a0
cf:pageTitle	Event:C7c9a623-5969-44a5-ab86-c741514301a0
cr:field	Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAs	https://dblp.org/db/conf/sigmetrics/sigmetrics2010

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